Projective invariance based on single view metrology

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Journal of Beijing University of Chemical Technology ›› 2008, Vol. 35 ›› Issue (5) : 98-102.

机电工程和信息科学

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 35(5): 98-102

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Received	Revised	Published
2008-04-01	1900-01-01	2008-09-20
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2008-09-20

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