Fault diagnosis of chemical process based on long short-term memory (LSTM)-denoising auto-encoder (DAE)

ZHANG JingChuan, TIAN HuiXin

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Journal of Beijing University of Chemical Technology ›› 2021, Vol. 48 ›› Issue (2) : 108-116. DOI: 10.13543/j.bhxbzr.2021.02.014

Fault diagnosis of chemical process based on long short-term memory (LSTM)-denoising auto-encoder (DAE)

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 48(2): 108-116 https://doi.org/10.13543/j.bhxbzr.2021.02.014

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